Scanning Probe Microscopy (SPM) is a family of techniques that use a sharp tip to scan the surface of a material. The tip is typically made of a conductive material, such as metal or carbon, and is mounted on a cantilever. The cantilever is attached to a piezoelectric scanner, which moves the tip across the surface of the material. As the tip scans the surface, it interacts with the material in a variety of ways, such as by mechanically contacting the surface, by interacting with the material’s electrical properties, or by interacting with the material’s magnetic properties.

Equipment Used for Moisture Analysis

There are a variety of different SPM techniques, each of which uses a different type of tip and scanning method. Some of the most common SPM techniques include:

• Atomic force microscopy (AFM): AFM uses a sharp tip to physically contact the surface of the material. The tip is mounted on a cantilever, which is attached to a piezoelectric scanner. The scanner moves the tip across the surface of the material, and the tip’s deflection is measured. The deflection of the tip is used to create an image of the surface of the material.
• Scanning tunneling microscopy (STM): STM uses a sharp tip to scan the surface of a material. The tip is mounted on a cantilever, which is attached to a piezoelectric scanner. The scanner moves the tip across the surface of the material, and the tunneling current between the tip and the surface is measured. The tunneling current is used to create an image of the surface of the material.
• Scanning capacitance microscopy (SCM): SCM uses a sharp tip to scan the surface of a material. The tip is mounted on a cantilever, which is attached to a piezoelectric scanner. The scanner moves the tip across the surface of the material, and the capacitance between the tip and the surface is measured. The capacitance is used to create an image of the surface of the material.

SPM techniques can be used to characterize a variety of different materials, including metals, ceramics, polymers, and biological materials. SPM techniques can be used to measure a variety of different properties of materials, such as their surface roughness, their electrical conductivity, and their magnetic properties.

Water Damage

SPM techniques can be used to detect and characterize water damage in materials. Water damage can cause a variety of problems, such as corrosion, mold growth, and structural damage. SPM techniques can be used to identify the location and extent of water damage, and to assess the severity of the damage. SPM techniques can also be used to monitor the drying process of water-damaged materials.