Atomic Force Microscopy (AFM) is one of the official methods approved by the American Society for Testing and Materials (ASTM) for moisture content determination in materials.

AFM is a non-destructive method that uses a sharp probe to scan the surface of a material and measure the force between the probe and the surface.

The moisture content of a material can be determined by measuring the change in the force between the probe and the surface as the moisture content changes.

Procedure:

• A small sample of the material is placed on a flat surface.
• The AFM probe is brought into contact with the surface of the material.
• The AFM probe is scanned across the surface of the material in a raster pattern.
• The force between the probe and the surface is measured as the probe is scanned.
• The moisture content of the material is determined by measuring the change in the force between the probe and the surface as the moisture content changes.

Advantages of AFM for Moisture Content Determination:

• Non-destructive
• Accurate
• Relatively fast
• Can be used on a variety of materials